Online link |
https://cmgds.marine.usgs.gov/catalog/whcmsc/open_file_report/ofr2002-152/QISO_meta.faq.html |
Description |
Mapping the thickness of the Quaternary sediment is useful for delineating the geologic framework of the New York Bight inner-continental shelf. This in turn aids in understanding the stratigraphic evolution of the inner-continental shelf, the regional sediment transport system, and the influence of the inner-shelf framework on coastal processes. The grid showing the thickness of Quaternary sediment is an important factor in the framework of the coastal region. |
Originators |
Denny, Jane F.; Foster, David S.; Schwab, William C.; Swift, B. Ann; Lotto, Linda L.; Allison, Mead A.; Uchupi, Elazar O.; Danforth, William W.; Thieler, E. Robert; and Butman, Bradford |