Interpretation of the thickness of Quaternary deposits on the inner-continental shelf within the New York Bight, derived from seismic data collected by the U.S. Geological Survey, 1995 - 1999 (Grid, UTM Zone 18N, WGS84 and Esri polyline shapefile, Geographic, WGS84)

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Description Mapping the thickness of the Quaternary sediment is useful for delineating the geologic framework of the New York Bight inner-continental shelf. This in turn aids in understanding the stratigraphic evolution of the inner-continental shelf, the regional sediment transport system, and the influence of the inner-shelf framework on coastal processes. The grid showing the thickness of Quaternary sediment is an important factor in the framework of the coastal region.
Originators Denny, Jane F.; Foster, David S.; Schwab, William C.; Swift, B. Ann; Lotto, Linda L.; Allison, Mead A.; Uchupi, Elazar O.; Danforth, William W.; Thieler, E. Robert; and Butman, Bradford

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